Semi-Markov Processes and Reliability (Statistics for Industry and Technology)
By Nakamura, Yugo, Davies, Joshua, Baumann, Tomato's Joel, Purgason, Todd, Clement, Manuel, Suga, Yasuto, Dawes, Brendan, Jankowski, Tomasz, Paterson, James, van der Grift, Ivo, Turner, thevoid's Luke, Odendaal, Andries, Jordan, Eric, Ke, Tony, Chan, Iren..., Limnios, N., Oprisan, G.
