By William Panek, Tylor Wentworth
By Mark Minasi, Darril Gibson, Tom Carpenter, Aidan Finn, Wendy Henry
By Ellen Siever
By Darril Gibson
By William Stanek
By William R. Stanek
By James L. Peterson, Abraham Silberschatz
By William Stallings
By William S. Davis, T.M. Rajkumar
By Ghori, Asghar
By Bauer, Klausdieter
By Graham, Steve, Simeonov, Simeon, Boubez, Toufic, Davis, Doug, Daniels, Glen, Nakamura, Yuichi, Neyama, Ryo
By Kruchten, Philippe
By Baig, Edward C.
By Blank–edelman, David N
By Spainhour, Stephen
By LeVitus, Bob
By Strang, John
By Oram, Andrew
By Levine, John
By Tim O'Reilly, Grace Todino
By Marc J. Rochkind
By Strang, J
By Siever, Ellen, Weber, Aaron, Figgins, Stephen, Love, Robert, Robbins, Arnold
By Matthias Kalle Dalheimer, Lar Kaufman, Matt Welsh
By Robbins, Arnold
By IEEE: *STANDARD, The Institute of Electrical and Electronics Engineers (IEEE)
By Lowe