By Karl-G. Grosse-Erdmann, Alfred Peris Manguillot
By Yves Coudene, Reinie Erne
By Jurgen Jost
By Viorel Barbu
By Mohammed Al-Gwaiz
By David F. Griffiths, Desmond J. Higham
By George A. Articolo (Rutgers University, New Brunswick, NJ, USA)
By Steven Holzner
By Martha L. Abell, James P. Braselton
By M. Tenenbaum
By Dexter J Booth, K. a Stroud
By Augusto Visintin
By C. Henry Edwards, David E. Penney
By Stanislaw H. Zak (Professor Electrical and Computer Engineering, Professor Electrical and Computer Engineering, Purdue University)
By William E. Boyce, Richard C. DiPrima
By Rainville, Earl D., Bedient, P.E.
By Richard Bronson, Gabriel Costa
By V.I. Arnold, Richard A. Silverman
By S. J. Taylor
By Allan M. Krall
By John Crank (Emeritus Professor, Emeritus Professor, Brunel University)
By S. L. Campbell, Richard Haberman
By Thompson, Silvanus P., Robert, Tim
By McMullen, Chris
By Arieh Iserles (University of Cambridge)
By Gregory L. Baker (Academy of the New Church College), Jerry P. Gollub (Haverford College, Pennsylvania)
By G. Gandolfo
By Earl David Rainville
By Paul DuChateau, D. W. Zachmann
By Marcus Pivato (Associate Professor, Trent University, Peterborough, Ontario)