By Harik, Vasyl Michael, Li-Shi Luo
By Awschalom, David D., Buhrman, Robert A., Daughton, James M., von Molnár, Stephan, Roukes, Michael L.
By Bergveld, H.J., Kruijt, W.S., Notten, P.H.L
By Antonov, Victor, Harmon, Bruce, Yaresko, Alexander
By Brongersma, Mark L., Kik, Pieter G.
By Williams, R.S., Alivisatos, P.
By Doktorov, Evgeny V., Leble, Sergey B.
By IM, Seongil, Chang, Youn-Gyoung, Kim, Jae Hoon
By Yan, Liang, Chen, I-Ming, Lim, Chee Kian, Yang, Guilin, Lee, Kok-Meng
By Drabowitch, S., Papiernik, A., Griffiths, Hugh, Encinas, J., Smith, B.L.
By Altman, C., Suchy, K.
By Gignoux, Claude, Silvestre-Brac, Bernard
By Hasegawa, Akira
By Mihelj, Matjaz, Novak, Domen, Beguš, Samo
By Friedland, Bernard
By Sen, P. C.
By Stonham, T. J.
By Sparkes, J.
By Smith, Ralph J., Dorf, Richard C.
By Helen Arney, Steve Mould
By Hart, Daniel W.
By Rezende, Sergio M.
By Hilchie, Douglas W.
By Bell, F. G., Whitehead, R. W.
By Crowe, John
By Vaccaro, Richard J.
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By Institution of Electrical Engineers
By Jackson, Leland B.