By Raj Betapudi, etc.
By Adrian Colyer, Andy Clement, George Harley, Matthew Webster
By Peter Coad, Eric LeFebvre, Jeff De Luca
By Peter Coad, Mark Mayfield, Jon Kern
By Victor Eijkhout
By Stanley B. Lippman, Josee Lajoie
By itSMF - the IT Service Management Forum
By Eric Ries
By L. Chaffin
By R. Allen Wyke, Richard Wagner
By Gordon Mccomb
By Dennis Ritchie, Brian Kernighan
By Mike Smart
By Eric Freeman, Elisabeth Robson, Bert Bates, Kathy Sierra
By Christian Bauer, Gavin King, Gary Gregory
By Ivor Horton
By Michael Dawson (UCLA)
By David Flanagan
By Jennifer Niederst
By Jennifer Niederst Robbins
By Wendy Willard
By John P Newton
By Alan Hinchliffe (Reader in Chemistry, UMIST (University of Manchester Institute of Science and Technology), Manchester M60 1QD, United Kingdom)
By Weste, N., Eshraghian, Kamran
By Herbert Schildt
By Eric F. Wolstenholme, Jay W. Forrester
By Davis Chapman
By Marten Deinum, Koen Serneels, Colin Yates, Seth Ladd, Erwin Vervaet
By Professor Federico Varese
By Scott Urman