Dale E. Newbury (National Institute of Standards and Technology, Gaithersburg, MD, USA), Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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- Books2Africa Collection
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- Kluwer Academic / Plenum Publishers
- ISBN-10
- 030640768X
- ISBN-13
- 9780306407680
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