By Fifield, F.W.
By Vogel, A.I.
By Fulton G. Kitson
By Clark, B.J., Frost, T., Russell, M.A.
By Pretsch, Erno, Clerc, Thomas, Seibl, Joseph, Simon, Wilhelm, Biemann, K.
By Robinson, Marin S., Stoller, Fredricka L., Costanza-Robinson, Molly, Jones, James K.
By Silverstein, Robert M., Webster, Francis X., Kiemle, David
By Miller, J.C., J.N.
By Fifield, F. W., Kealey, D.
By BUDEVSKY, O
By Whiston, Clive, Prichard, Elizabeth
By Harris, Daniel C.
By J. Mendham, R.C. Denney, J. D. Barnes, M.J.K. Thomas
By David M. Heyes (University of Surrey, UK)
By J. Michael Hollas (University of Reading, UK)
By Horst Friebolin
By Hobart H. Willard, etc., Lynne L. Merritt Jr (Emeritus, Indiana University, USA), John Dean (Emeritus, University of Tennessee, Knoxville, Frank A. Settoe Jr (Virginia Military Institute
By D Pletcher, R Greff, R Peat, L M Peter, J Robinson (Southampton Electrochemistry Group)
By Robert G. Laughlin (The Proctor and Gamble Company)
By Bernd Neidhart, W. Wegscheider
By G. Subramanian
By Paul C. Sadek
By Richard B. Cole
By Hans-Otto Kalinowski (Justus-Liebig University, Federal Republic of Germany), Stefan Berger (University of Marburg, Siegmar Braun (The Technical College of Darmstadt, Federal Republic of Germany. Translated by Jack K. Becc...
By Georges Guiochon, etc., S. Golshan-Shirazi (Applied Analytical Industries, Wilmington, North Carolina, USA), Anita M. Katti (Mallinckrodt, St Louis, Missouri
By David R. Lide (National Institute of Standards & Technology (Retired), Gaithersburg, Maryland, USA)
By Satinder Ahuja
By Gary S. Silverman, Philip E. Rakita
By David C. Palmer (Johnson & Johnson Pharmaceutical Research & Development, L.L.C., Raritan, New Jersey, USA)