Franco, Jacopo, Kaczer, Ben, Groeseneken, Guido
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications: 47 (Springer Series in Advanced Microelectronics, 47)
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- Books2Africa Collection
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- Published
- 29th October 2013
- Publisher
- Springer
- ISBN-10
- 9400776624
- ISBN-13
- 9789400776623
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