IM, Seongil, Chang, Youn-Gyoung, Kim, Jae Hoon

Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors (SpringerBriefs in Physics)

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Books2Africa Collection
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Published
7th May 2013
Publisher
Springer
ISBN-10
9789400763913
ISBN-13
9789400763913
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