IM, Seongil, Chang, Youn-Gyoung, Kim, Jae Hoon
Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors (SpringerBriefs in Physics)
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- Published
- 7th May 2013
- Publisher
- Springer
- ISBN-10
- 9789400763913
- ISBN-13
- 9789400763913
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